Search Type
  • All
  • Subject
  • Title
  • Author
  • Publisher
  • Series Title
Search Title
Displaying 1- 6 of 6 results for keyword "Said-Hamdioui" books

Defects, Fault Models and Test Patterns
Author:
Hamdioui, Said
ISBN:
978-1-4020-7752-4
Book Format:
Hardback
List Price:
USD $109.99
Publisher:
Springer
Publication Date:
Mar 2004

Defects, Fault Models and Test Patterns
Author:
Hamdioui, Said
ISBN:
978-1-4419-5430-5
Book Format:
Paperback
List Price:
USD $109.99
Publisher:
Springer
Publication Date:
Dec 2010

Defects, Fault Models and Test Patterns
Author:
Hamdioui, Said
ISBN:
978-1-4419-5430-5
Book Format:
Paperback
List Price:
AUD $367.95
Publisher:
Springer
Publication Date:
Sep 2010

Author:
Hamdioui, Said
Orailoglu, A.
ISBN:
978-1-4244-1277-8
Book Format:
Paperback
List Price:
USD $216.00
Publisher:
IEEE
Publication Date:
Jan 2007

Defects, Fault Models and Test Patterns
Author:
Hamdioui, Said
ISBN:
978-1-4757-6706-3
Book Format:
Ebook
List Price:
USD $199.00
Publisher:
Springer
Publication Date:
Jun 2013

Defects, Fault Models and Test Patterns
Author:
Hamdioui, Said
ISBN:
978-1-4020-7752-4
Book Format:
Hardback
List Price:
AUD $367.95
Publisher:
Springer London, Limited
Publication Date:
Jun 2004