Books By Taeho Kim, Taeho

Displaying 1- 3 of 3 results for keyword "Way-Way-Kuo" books

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1.		Reliability, Yield, and Stress Burn-In A Unified Approach for Microelectronics... Author: Way Kuo, Way Wei-Ting Kary Chien, Wei-Ting Kary Taeho Kim, Taeho ISBN: 978-1-4613-7596-8 Book Format: Paperback List Price: USD $169.99 Publisher: Springer Publication Date: Mar 2014 Quantity Note

2.		Reliability, Yield, and Stress Burn-In A Unified Approach for Microelectronics... Author: Way Kuo, Way Wei-Ting Kary Chien, Wei-Ting Kary Taeho Kim, Taeho ISBN: 978-1-4613-7596-8 Book Format: Paperback List Price: AUD $415.95 Publisher: Springer Publication Date: Sep 2014 Quantity Note

3.		Reliability, Yield, and Stress Burn-In A Unified Approach for Microelectronics... Author: Way Kuo, Way Wei-Ting Kary Chien, Wei-Ting Kary Taeho Kim, Taeho ISBN: 978-1-4615-5671-8 Book Format: Ebook List Price: USD $309.00 Publisher: Springer Publication Date: Nov 2013 Quantity Note