Emerging Nanotechnologies Test, Defect Tolerance, and Reliability |
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| Editor:
| Tehranipoor, Mohammad |
| Series title: | Frontiers in Electronic Testing Ser. |
| ISBN: | 978-1-4419-4513-6 |
| Publication Date: | Feb 2010 |
| Publisher: | Springer London, Limited
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| Book Format: | Paperback |
| List Price: | AUD $494.95 |
Book Description:
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An account of strengths and disadvantages of new technologies, including chemically assembled electronic nanotechnology, Quantum-dot Cellular Automata, nanowires and carbon nanotubes. The book offers a single source of reference in a rapidly changing field.
An account of strengths and disadvantages of new technologies, including chemically assembled electronic nanotechnology, Quantum-dot Cellular Automata, nanowires and carbon nanotubes. The book offers a single source of reference in a rapidly changing field.