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Displaying 1- 20 of 52
1 2 3

Author:
Bushnell, Michael L.
Agrawal, Vishwani D.
ISBN:
978-0-7923-7991-1
Book Format:
Hardback
List Price:
AUD $228.95
Publisher:
Springer London, Limited
Publication Date:
Jan 2000

Author:
Bushnell, M.
Agrawal, Vishwani
ISBN:
978-0-306-47040-0
Book Format:
Ebook
List Price:
USD $104.00
Publisher:
Springer London, Limited
Publication Date:
Apr 2006

Author:
Mazumder, Pinaki
Chakraborty, Kanad
ISBN:
978-1-4612-8632-5
Book Format:
Paperback
List Price:
AUD $386.95
Publisher:
Springer London, Limited
Publication Date:
Sep 2011

The Macro Test Approach
Author:
Beenker, F. P.
Thijssen, A. P.
Bennetts, R. G.
ISBN:
978-0-7923-9658-1
Book Format:
Hardback
List Price:
AUD $494.95
Publisher:
Springer London, Limited
Publication Date:
Jan 1995

Test, Defect Tolerance, and Reliability
ISBN:
978-0-387-74747-7
Book Format:
Ebook
List Price:
USD $249.00
Publisher:
Springer London, Limited
Publication Date:
Dec 2007

Author:
Stroud, Charles E.
ISBN:
978-1-4020-7050-1
Book Format:
Hardback
List Price:
AUD $456.95
Publisher:
Springer London, Limited
Publication Date:
Jan 2002

Design Principles, Fault Modeling and Self-Test
Author:
Adams, R. Dean
ISBN:
978-1-4020-7255-0
Book Format:
Hardback
List Price:
AUD $415.95
Publisher:
Springer London, Limited
Publication Date:
Jan 2002

Simulation and Applications
Author:
Khare, Jitendra B.
Maly, Wojciech
ISBN:
978-1-4612-8595-3
Book Format:
Paperback
List Price:
AUD $269.95
Publisher:
Springer London, Limited
Publication Date:
Sep 2011

Author:
Sousa, José T. de
Cheung, Peter Y. K.
ISBN:
978-0-7923-7314-8
Book Format:
Hardback
List Price:
AUD $440.95
Publisher:
Springer London, Limited
Publication Date:
Jan 2001

Author:
Nicolici, Nicola
Al-Hashimi, Bashir M.
ISBN:
978-1-4020-7235-2
Book Format:
Hardback
List Price:
AUD $338.95
Publisher:
Springer London, Limited
Publication Date:
Jan 2003

Challenges and Methodologies
ISBN:
978-0-387-29409-4
Book Format:
Ebook
List Price:
USD $249.00
Publisher:
Springer London, Limited
Publication Date:
Jan 2006

Design Principles, Fault Modeling and Self-Test
Author:
Adams, R. Dean
ISBN:
978-0-306-47972-4
Book Format:
Ebook
List Price:
Contact Supplier contact USD $239.00
Publisher:
Springer London, Limited
Publication Date:
Apr 2006

Author:
Kabisatpathy, Prithviraj
Barua, Alok
Sinha, Satyabroto
ISBN:
978-0-387-25743-3
Book Format:
Ebook
List Price:
USD $179.00
Publisher:
Springer London, Limited
Publication Date:
Jan 2006

A Guide to the IEEE 1149. 4 Test Standard
Author:
Nicolici, Nicola
Al-Hashimi, Bashir M.
ISBN:
978-0-306-48731-6
Book Format:
Ebook
List Price:
USD $209.00
Publisher:
Springer London, Limited
Publication Date:
Apr 2006

Author:
Gössel, Michael
Ocheretny, Vitaly
Sogomonyan, Egor
Marienfeld, Daniel
ISBN:
978-1-4020-8420-1
Book Format:
Ebook
List Price:
USD $189.00
Publisher:
Springer London, Limited
Publication Date:
Apr 2008

ISBN:
978-1-4613-7798-6
Book Format:
Paperback
List Price:
AUD $290.95
Publisher:
Springer London, Limited
Publication Date:
Oct 2012

Author:
Chen, Xinghao
Bushnell, Michael L.
ISBN:
978-1-4612-8571-7
Book Format:
Paperback
List Price:
AUD $290.95
Publisher:
Springer London, Limited
Publication Date:
Sep 2011

Author:
Chakravarty, Sreejit
Thadikaran, Paul J.
ISBN:
978-0-7923-9945-2
Book Format:
Hardback
List Price:
AUD $494.95
Publisher:
Springer London, Limited
Publication Date:
Jan 1997

Rationale and Application of IEEE Std. 1500(tm)
Author:
da Silva, Francisco
McLaurin, Teresa
Waayers, Tom
ISBN:
978-0-387-34609-0
Book Format:
Ebook
List Price:
USD $209.00
Publisher:
Springer London, Limited
Publication Date:
Sep 2006

Logic Synthesis and Verification Using...
Author:
Kunz, Wolfgang
Stoffel, Dominik
ISBN:
978-0-7923-9921-6
Book Format:
Hardback
List Price:
AUD $451.95
Publisher:
Springer London, Limited
Publication Date:
Jan 1997
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