CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies Process-Aware SRAM Design and Test |
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| Author:
| Pavlov, Andrei
Sachdev, Manoj |
| Series title: | Frontiers in Electronic Testing Ser. |
| ISBN: | 978-90-481-7855-1 |
| Publication Date: | Oct 2010 |
| Publisher: | Springer Netherlands
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| Imprint: | Springer |
| Book Format: | Paperback |
| List Price: | USD $179.99 |
Book Description:
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This book covers a broad range of topics related to SRAM design and testing. It includes everything from SRAM operation basics through cell electrical and physical design to process-aware and economical approach to SRAM testing.
This book covers a broad range of topics related to SRAM design and testing. It includes everything from SRAM operation basics through cell electrical and physical design to process-aware and economical approach to SRAM testing.