Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits |
|
| Author:
| Sachdev, Manoj |
| Series title: | Frontiers in Electronic Testing Ser. |
| ISBN: | 978-1-280-93821-4 |
| Publication Date: | Jan 2010 |
| Publisher: | Springer
|
| Book Format: | Ebook |
| List Price: | USD $318.00 |
Book Description:
|
The progression developed in this book is essential to understand new test methodologies, algorithms and industrial practices. Without the insight into the physics of nano-metric technologies, it would be hard to develop system-level test strategies that yield a high IC fault coverage. Obviously, the work on defect-oriented testing presented in the book is not final, and it is an evolving field with interesting challenges imposed by the ever-changing nature of nano-metric technologies....
More DescriptionThe progression developed in this book is essential to understand new test methodologies, algorithms and industrial practices. Without the insight into the physics of nano-metric technologies, it would be hard to develop system-level test strategies that yield a high IC fault coverage. Obviously, the work on defect-oriented testing presented in the book is not final, and it is an evolving field with interesting challenges imposed by the ever-changing nature of nano-metric technologies. Test and design practitioners from academia and industry will find that Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits lays the foundations for further pioneering work.