Lock-In Thermography Basics and Use for Evaluating Electronic Devices and Materials |
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| Author:
| Breitenstein, Otwin
Warta, Wilhelm
Langenkamp, Martin |
| Series title: | Springer Series in Advanced Microelectronics Ser. |
| ISBN: | 978-3-642-26478-8 |
| Publication Date: | Nov 2012 |
| Publisher: | Springer
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| Book Format: | Paperback |
| List Price: | USD $159.99 |
Book Description:
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Lock-in Thermography focuses on this sensitive infrared measurement system that offers a more effective analytical capability. Though mainly covering applications in electronic materials and devices, readers will also find treatment of nondestructive evaluation.
Lock-in Thermography focuses on this sensitive infrared measurement system that offers a more effective analytical capability. Though mainly covering applications in electronic materials and devices, readers will also find treatment of nondestructive evaluation.